SWIR LEDs 1,040–1,650nm · extended 1,720/1,900nm models
Documentation and samples
Send the model, target wavelength, package and quantity so we can confirm document access and sample availability.
Selection points
DOWA comparison data
For the 1,300nm SMD product, DOWA reports a radiant-output improvement against its reference bare die under stated comparison conditions. Confirm application conditions in the datasheet.
Production range
Available quantity and lead time are confirmed by wavelength and package model.
Package selection
Bare die, SMD and die-array formats can be matched to the optical system and assembly process.
Standard and extended ranges
Choose from standard 1,040–1,650nm models and the separately identified 1,720/1,900nm extended models.
Small bare die (350×350 μm)
The standard range is 1,040–1,650nm; 1,720/1,900nm are extended models. Electrical and optical values below retain the published model table.
| Model | Peak λ | Po @20mA | Vf | Chip size | Application |
|---|---|---|---|---|---|
| SECSR | 1,040 nm | 11.0 mW | 1.3 V | 350×350 μm | Glucose · Alcohol · Water |
| SSCSR | 1,060 nm | 10.4 mW | 1.2 V | 350×350 μm | Healthcare sensing |
| SRCSR | 1,080 nm | 9.8 mW | 1.2 V | 350×350 μm | Healthcare sensing |
| SUCSR | 1,100 nm | 10.4 mW | 1.2 V | 350×350 μm | General SWIR |
| SVCSR | 1,140 nm | 8.0 mW | 1.2 V | 350×350 μm | Reference channel |
| E2RF2S | 1,200 nm | 5.2 mW | 1.0 V | 350×350 μm | Methane · CH₄ band |
| E3RF2S | 1,300 nm | 5.8 mW | 1.0 V | 350×350 μm | Si-transparent · wafer inspection |
| E3HF2S | 1,350 nm | 5.2 mW | 0.9 V | 350×350 μm | Glucose · alcohol |
| E4RF2S | 1,460 nm | 4.5 mW | 0.9 V | 350×350 μm | Water absorption peak |
| E5RF2S | 1,550 nm | 3.7 mW | 0.9 V | 350×350 μm | Lipid · CO₂ short band |
| E6RF2S | 1,650 nm | 2.8 mW | 0.8 V | 350×350 μm | CO · lipid |
| E7RF2S | 1,720 nm | 2.5 mW | 0.8 V | 350×350 μm | Extended SWIR |
| E9RF2S | 1,900 nm | 2.1 mW | 0.8 V | 350×350 μm | Extended SWIR |
Large bare die (1080×1080 μm)
Compare models using the stated 1.5A condition and model-specific output values.
| Model | Peak λ | Po @1.5A | Vf | Chip size | Application |
|---|---|---|---|---|---|
| SE09S | 1,040 nm | 575 mW | 1.5 V | 1080×1080 μm | High-power illumination |
| SS09S | 1,060 nm | 557 mW | 1.5 V | 1080×1080 μm | High-power illumination |
| SU09S | 1,100 nm | 543 mW | 1.5 V | 1080×1080 μm | Industrial inspection |
| E3RXBR | 1,300 nm | 230 mW | 1.3 V | 1080×1080 μm | Wafer inspection (high-power) |
| E4RXBR | 1,460 nm | 162 mW | 1.3 V | 1080×1080 μm | Moisture imaging |
| E5RXBR | 1,550 nm | 140 mW | 1.3 V | 1080×1080 μm | High-power lipid sensing |
| E6RXBR | 1,650 nm | 86 mW | 1.2 V | 1080×1080 μm | High-power CO/lipid |
* SMD, array and custom-bonding availability is confirmed by model and quantity.
Applications
- Non-invasive healthcare sensing
- Alcohol sensors
- Gas sensors
- Semiconductor wafer inspection
- Food and agriculture QC
- Anti-counterfeiting
- Biometric authentication
- Machine vision
SWIR wavelength review by application
Candidate wavelengths depend on absorption characteristics and detector configuration. Use this as an initial guide and confirm the final model against system conditions and datasheets.
| Application | Candidate wavelength | Review notes |
|---|---|---|
| Healthcare sensing | 1,040 – 1,100 nm | Both small and large die models are listed; evaluate illuminated area and drive conditions together. |
| Semiconductor wafer inspection | 1,300 nm | A candidate wavelength for silicon transmission inspection; small E3RF2S and large E3RXBR models are listed. |
| Moisture measurement · food QC | 1,460 nm | A candidate for water-absorption measurements; verify detector sensitivity and optical path. |
| Lipid analysis | 1,550 nm | A candidate wavelength for lipid-related measurements; validate against the actual sample spectrum. |
| Extended SWIR | 1,720 / 1,900 nm | E7RF2S and E9RF2S extended models, identified separately from the 1,040–1,650nm standard range. |
Frequently asked questions
Q.What wavelength range is covered?+
Q.Which models are listed for wafer inspection?+
Q.How do I request samples and datasheets?+
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Share target wavelength, drive current, output, package and quantity. We will check the relevant model documentation and availability.